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media: mt9m111: add V4L2_CID_TEST_PATTERN control
authorAkinobu Mita <akinobu.mita@gmail.com>
Wed, 3 Jan 2018 18:22:47 +0000 (13:22 -0500)
committerMauro Carvalho Chehab <mchehab@s-opensource.com>
Fri, 5 Jan 2018 17:51:36 +0000 (12:51 -0500)
commit74e08739c0f7400cf2c0e1ddf4c52e24aad1768a
treeaf6a55ce9e83fc70107b27fd2847e491e1405dd2tree | snapshot
parent6705d55cfe148ee4fa37ded3417a76f2ae533b2ecommit | diff
media: mt9m111: add V4L2_CID_TEST_PATTERN control

The mt9m111 has the test pattern generator features.  This makes use of
it through V4L2_CID_TEST_PATTERN control.

Cc: Mauro Carvalho Chehab <mchehab@s-opensource.com>
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
drivers/media/i2c/mt9m111.c diff | blob | history
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